Detection of defects in extended products based on two-dimensional scanning results
Abstract
Detection of defects in extended products based on two-dimensional scanning results
Incoming article date: 15.12.2023The article discusses a method for detecting defects in extended products. To find defects, scanning the product along its entire length is used. The result is a two-dimensional data stream that needs to be analyzed. The problem of detecting a defect is one of the tasks of detecting a “useful” signal against a background of “noise”. The most reliable method is to use a set of statistical criteria. To compare the mean values, the Student's test and two Wilcoxon–Mann–Whitney tests were used; to compare the scattering values, the Fisher test and the Ansari–Bradley test were used. The effectiveness of the algorithm was confirmed using a computer model simulating a two-dimensional homogeneous data stream.
Keywords: defects, extended products, computer model, simulation, statistical criterion